Year 2018 - Issue 6 - November-December
SIRR 2018

On the use of highly pixellated CMOS imagers to measure therapeutic beam profile

Authors: L. Servoli, L. Alunni Solestizi, M. Biasini, S. Fabiani, M. Italiani, K. Kanxheri, P. Tucceri
DOI: 10.1393/ncc/i2018-18216-3
Published online 2 May 2019
Article: 216
Open Access
Download fulltext