Il Nuovo Cimento C

Year 2019 - Issue 5 - September-October
SIF Congress 2018

Imaging detectors based on photoluminescence of radiation-induced defects in lithium fluoride for XFEL beam monitoring

Authors: F. Bonfigli on behalf of F. Capotondi, A. Cricenti, L. Giannessi, M. Kiskinova, M. Luce, N. Mahne, M. Manfredda, R. M. Montereali, E. Nichelatti, E. Pedersoli, L. Raimondi, M. A. Vincenti, M. Zangrando
DOI: 10.1393/ncc/i2019-19237-0
Published online 10 January 2020
Article: 237
Open Access
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